Automated Fault Diagnosis in Embedded Systems

Automated fault diagnosis is emerging as an important factor in achieving an acceptable and competitive cost/dependability ratio for embedded systems. In this paper, we survey model-based diagnosis and spectrum-based fault localization, two state-of-the-art approaches to fault diagnosis that jointly cover the combination of hardware and control software typically found in embedded systems. We present an introduction to the field, discuss our recent research results, and report on the application on industrial test cases. In addition, we propose to combine the two techniques into a novel, dynamic modeling approach to software fault localization.