DocumentCode
2311532
Title
The morphology, microstructure and luminescent properties of CdS/CdTe thin film solar cells
Author
Al-Jassim, M.M. ; Hasoon, F.S. ; Jones, K.M. ; Keyes, B.M. ; Matson, R.J. ; Moutinho, H.R.
Author_Institution
Nat. Renewable Energy Lab., Golden, CO, USA
fYear
1993
fDate
10-14 May 1993
Firstpage
459
Lastpage
465
Abstract
The morphology, microstructure and the luminescent properties of CdS and CdTe films were studied. The CdS films were grown by the solution growth method. The CdTe was deposited by either close space sublimation or physical vapor deposition. As-grown CdS films were polycrystalline with a grain size in the 200-600 Å range. Significant grain growth and reduction in defect density were observed in these films after CdCl2 heat treatment. The CdTe films exhibited a high density of grain boundaries and structural defects within the grains. Both grain boundaries and intragrain defects are very active recombination sites. CdCl2 treatment effected a marked grain growth and reduction in the recombination efficiency of the grain boundaries and intragrain defects
Keywords
II-VI semiconductors; cadmium compounds; crystal morphology; electron-hole recombination; grain boundaries; grain growth; heat treatment; luminescence; semiconductor growth; semiconductor thin films; solar cells; 200 to 600 A; CdCl2; CdCl2 heat treatment; CdS films; CdS-CdTe; CdS/CdTe thin film solar cells; active recombination sites; close space sublimation; defect density reduction; grain boundaries; grain growth; grain size; intragrain defects; luminescent properties; microstructure; morphology; physical vapor deposition; polycrystalline; recombination efficiency; solution growth method; structural defects; Atomic force microscopy; Grain boundaries; Grain size; Heat treatment; Microstructure; Morphology; Photovoltaic cells; Scanning electron microscopy; Substrates; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
Conference_Location
Louisville, KY
Print_ISBN
0-7803-1220-1
Type
conf
DOI
10.1109/PVSC.1993.347138
Filename
347138
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