DocumentCode
2311609
Title
Which Spot Should I Test for Effective Embedded Software Testing?
Author
Seo, Jooyoung ; Ki, Yuhoon ; Choi, Byoungju ; La, Kwanghyun
Author_Institution
Dept. of Comput. Sci. & Eng., Ewha Univ., Seoul
fYear
2008
fDate
14-17 July 2008
Firstpage
135
Lastpage
142
Abstract
Today, the embedded industry is changing fast - systems have become larger, more complex, and more integrated. Embedded system consists of heterogeneous layers such as hardware, HAL, device driver, OS kernel, and application. These heterogeneous layers are usually customized for special purpose hardware. Therefore, various hardware and software components of embedded system are mostly integrated together under unstable status. That is, there are more possibilities of faults in all layers unlike package software.In this paper, we propose the embedded software interface as two essential parts: interface function that represents the statement of communication between heterogeneous layers, and interface variable that represents software and/or hardware variable which are defined in different layer from integrated software and used to expected output for decision of fault. Also, we statically investigate various views of embedded software interface and demonstrate that proposed interface should be new criterion for effective embedded software testing.
Keywords
device drivers; embedded systems; operating system kernels; program testing; OS kernel; device driver; embedded industry; embedded software interface; embedded software testing; embedded system; Embedded software; Embedded system; Fault detection; Fault diagnosis; Hardware; Packaging; Software packages; Software performance; Software testing; System testing; Embedded software testing; embedded software interface; empirical studies; integration testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Secure System Integration and Reliability Improvement, 2008. SSIRI '08. Second International Conference on
Conference_Location
Yokohama
Print_ISBN
978-0-7695-3266-0
Electronic_ISBN
978-0-7695-3266-0
Type
conf
DOI
10.1109/SSIRI.2008.38
Filename
4579805
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