DocumentCode :
2311624
Title :
Model-based control of a copper micro plating process
Author :
Marschner, U. ; Hoffmann, J. ; Sadowski, G. ; Hoffmann, T. ; Fischer, W.-J.
Author_Institution :
Semicond. & Mikrosyst. Technol. Lab., Tech. Univ. Dresden, Germany
Volume :
1
fYear :
1998
fDate :
1-4 Sep 1998
Firstpage :
491
Abstract :
The monitoring of a copper micro plating process by parameter estimation is investigated. The basis of the parameter estimation is a mathematical model of the relationship between electrical current density and potential which includes new approximations and which depends nonlinear on the parameters. The estimated parameters are used to adjust the copper micro plating process. In the first part of the paper the process is explained and the mathematical model including new approximations is presented. In the second part this model is used to estimate process parameters and results of measurement fits are shown followed by a conclusion
Keywords :
condition monitoring; copper micro plating process; electrical current density; measurement fits; model-based control;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Control '98. UKACC International Conference on (Conf. Publ. No. 455)
Conference_Location :
Swansea
ISSN :
0537-9989
Print_ISBN :
0-85296-708-X
Type :
conf
DOI :
10.1049/cp:19980278
Filename :
727971
Link To Document :
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