• DocumentCode
    2311649
  • Title

    Oxidation properties of Sn-Cu-Ni solders with minor alloying additions

  • Author

    Chang-Chien, Yu-Chien ; Song, Jenn-Ming ; Huang, Bo-Chang ; Chen, Wei-Ting ; Shie, Chi-Rung ; Hsu, Chuang-Yao

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nat. Dong Hwa Univ., Hualien, Taiwan
  • fYear
    2010
  • fDate
    20-22 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Considering that solder surface may lose its brightness due to oxidation during the assembly and operation of electronic device, this study investigated the surface properties of Sn-Cu-Ni solders using UV-visible and X-ray photoelectron spectroscopies. The degree of discoloring could be evaluated by the reflectance of the sample surface in the visible light range. Two distinct absorption peaks respectively located at about 400 nm and between 250 and 300 nm were identified, which could be considered stemming from the formation of SnO and SnO2 respectively. A minor addition of phosphorus can significantly reduce the discoloring of solders under both solid and semi-solid states. The formation of P2O5 and thus the suppression of SnO were also verified.
  • Keywords
    X-ray photoelectron spectra; alloying additions; aluminium alloys; copper alloys; nickel alloys; oxidation; phosphorus alloys; reflectivity; solders; tin alloys; ultraviolet spectra; visible spectra; SnCuNiAl; SnCuNiP; UV-visible photoelectron spectroscopies; X-ray photoelectron spectroscopies; electronic device; minor alloying additions; oxidation properties; semisolid states; solder surface; solid states;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4244-9783-6
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2010.5699516
  • Filename
    5699516