• DocumentCode
    2311652
  • Title

    Two-Dimensional Software Reliability Assessment with Testing-Coverage

  • Author

    Inoue, Shinji ; Yamada, Shigeru

  • Author_Institution
    Dept. of Manage. of Social Syst. & Civil Eng., Tottori Univ., Tottori
  • fYear
    2008
  • fDate
    14-17 July 2008
  • Firstpage
    150
  • Lastpage
    157
  • Abstract
    We propose a two-dimensional SRGM describing a software reliability growth process on the two-dimensional time-space which consists of testing-time and testing-coverage. Our two-dimensional SRGM conserves the theoretical means for the effect of such two-types of the reliability growth factors to the software reliability growth process. And we also discuss a parameter estimation method and a software reliability assessment measure of our model. Further, we show numerical examples for software reliability analysis by using actual data. Finally, we conduct goodness-of-fit evaluation of our model to the actual data, and see that our model has a better performance than representative one-dimensional SRGMs in terms of mean squared errors.
  • Keywords
    mean square error methods; parameter estimation; software reliability; SRGM; mean squared errors; parameter estimation method; software reliability growth models; testing coverage; testing time; two dimensional software reliability assessment; Civil engineering; Conference management; Engineering management; Parameter estimation; Reliability engineering; Reliability theory; Software measurement; Software reliability; Software testing; System testing; Cobb-Douglas Production Function; Goodness-of-Fit; Parameter Estimation; Software Reliability Assessment Measures; Software Reliability Growth Model; Testing-Coverage; Two-Dimensional NHPP;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Secure System Integration and Reliability Improvement, 2008. SSIRI '08. Second International Conference on
  • Conference_Location
    Yokohama
  • Print_ISBN
    978-0-7695-3266-0
  • Electronic_ISBN
    978-0-7695-3266-0
  • Type

    conf

  • DOI
    10.1109/SSIRI.2008.21
  • Filename
    4579807