Title :
High-permittivity thin films for tunable microwave circuits
Author :
Stemmer, Susanne ; Lu, Jiwei ; Finstrom, Nicholas H. ; Park, Jaehoon ; Keane, Sean P. ; Pervez, Nadia K. ; Schmidt, Steffen ; Boesch, Damien S. ; Jalan, Bharat ; Klenov, Dmitri O. ; Cagnon, Joel ; York, Robert A.
Author_Institution :
Univ. of California, Santa Barbara
Abstract :
In this presentation we will discuss some of our recent work aimed at elucidating challenges in optimizing materials and devices for high dielectric tunabilities and low losses. We will address the role of nonstoichiometry, electrode interfaces, film stresses and orientation in determining the dielectric properties. We show that dielectric properties must be measured over a wide frequency and temperature range to correctly identify the reasons for the strongly modified properties of thin films.
Keywords :
circuit tuning; dielectric losses; dielectric thin films; microwave circuits; permittivity; dielectric losses; dielectric properties; dielectric tunabilities; electrode interfaces; film stresses; high-permittivity thin films; nonstoichiometry; tunable microwave circuits; Dielectric devices; Dielectric losses; Dielectric materials; Dielectric thin films; Electrodes; Microwave circuits; Microwave devices; Stress; Thin film circuits; Tunable circuits and devices;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2007 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-0877-1
Electronic_ISBN :
978-1-4244-0878-8
DOI :
10.1109/APS.2007.4395846
