Title :
Improving Software Integration from Requirement Process with a Model-Based Object-Oriented Approach
Author :
Chang, Chih-Hung ; Lu, Chih-Wei ; Chu, William C.
Author_Institution :
Dept. of Inf. Manage., Hsiuping Inst. of Technol., Taipei
Abstract :
Sustaining uniformity of software artifacts from phases through software lifecycle is very important for efficient software evolution and maintenance. Most requirement documents were written in ambiguous natural language which is less formal and imprecise. Without proper modeling, the requirement information and knowledge is captured laboriously and informally, thus the following integration with other artifacts is nearly inaccessible. In this paper, we propose a Model-based Object-oriented approach to Requirement Engineering (MORE) to support and improve the consistency and maintenance of software requirement documents. By applying the approach to requirement process, the domain knowledge can be captured in a well-defined way systematically from the very early stage. Thereafter the completeness, traceability and reusability of requirement and its integration with artifacts of other phases is improved.
Keywords :
document handling; formal specification; object-oriented programming; software maintenance; software prototyping; software reliability; software reusability; systems analysis; MORE; ambiguous natural language; model-based object-oriented-to-requirement engineering; requirement document; software artifact; software consistency; software evolution; software integration; software lifecycle; software maintenance; software reusability; software traceability; Computer science; Information management; Natural languages; Object oriented modeling; Programming; Read only memory; Reliability engineering; Software maintenance; Unified modeling language; XML; Object-oriented; Software Maintenance; Software Models; Software Requirement; UML;
Conference_Titel :
Secure System Integration and Reliability Improvement, 2008. SSIRI '08. Second International Conference on
Conference_Location :
Yokohama
Print_ISBN :
978-0-7695-3266-0
Electronic_ISBN :
978-0-7695-3266-0
DOI :
10.1109/SSIRI.2008.39