DocumentCode
2311802
Title
EMI improvement study on advanced package design
Author
Sung, Robert ; Chiang, Kevin ; Lee, Daniel ; Chen, Carl
Author_Institution
Siliconware Precision Ind. Co., Ltd., Taichung, Taiwan
fYear
2010
fDate
20-22 Oct. 2010
Firstpage
1
Lastpage
4
Abstract
At the present time, the package design faces demands, including the high-speed switching, low-voltage bias and minimization. The high-speed signals may induce not only signal integrity and power integrity issues, but also cause radiation and electromagnetic interference (EMI) problems. To evaluate a package design, near-field scan is a useful technique to investigate the radiation behavior. Our study is based on this near-field approach to estimate the radiation of a package by using a simulation tool. Several factors were investigated in this study. From the near-field results, we could conclude some useful concepts for package layout design.
Keywords
electromagnetic interference; integrated circuit packaging; EMI; electromagnetic interference; high-speed switching; low-voltage bias; near- field scan; package design; Copper; Electric fields; Electromagnetic interference; Layout; Noise; Substrates; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
Conference_Location
Taipei
ISSN
2150-5934
Print_ISBN
978-1-4244-9783-6
Electronic_ISBN
2150-5934
Type
conf
DOI
10.1109/IMPACT.2010.5699527
Filename
5699527
Link To Document