• DocumentCode
    2311802
  • Title

    EMI improvement study on advanced package design

  • Author

    Sung, Robert ; Chiang, Kevin ; Lee, Daniel ; Chen, Carl

  • Author_Institution
    Siliconware Precision Ind. Co., Ltd., Taichung, Taiwan
  • fYear
    2010
  • fDate
    20-22 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    At the present time, the package design faces demands, including the high-speed switching, low-voltage bias and minimization. The high-speed signals may induce not only signal integrity and power integrity issues, but also cause radiation and electromagnetic interference (EMI) problems. To evaluate a package design, near-field scan is a useful technique to investigate the radiation behavior. Our study is based on this near-field approach to estimate the radiation of a package by using a simulation tool. Several factors were investigated in this study. From the near-field results, we could conclude some useful concepts for package layout design.
  • Keywords
    electromagnetic interference; integrated circuit packaging; EMI; electromagnetic interference; high-speed switching; low-voltage bias; near- field scan; package design; Copper; Electric fields; Electromagnetic interference; Layout; Noise; Substrates; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4244-9783-6
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2010.5699527
  • Filename
    5699527