Title : 
Effect of the substrate, metal-line and surface material on the performance of RFID tag antenna
         
        
            Author : 
Cho, Chihyun ; Kim, Dokyun ; Choo, Hosung ; Park, Ikmo
         
        
            Author_Institution : 
Hongik Univ., Seoul
         
        
        
        
        
        
            Abstract : 
The radio frequency identification (RFID) is being used widely in various environments such as stores, factories, security systems and transportation cards, etc. A great deal of research has been reported on the development of tag antennas, but the effects of the substrates and metal-lines on the performance of a tag antenna have not been studied in detail. In addition, there have been few studies on the performance degradation of a tag depending on the target´s surface material to which the tag antenna is attached. In this paper, we examine how the characteristics of a tag antenna are altered by the substrate and metal-line materials. A simple tag antenna with the meander line radiator and T-matching network is optimized using Pareto genetic algorithm (PGA) to guarantee the maximum performance under variety of conditions. We then observe the effects of various targets´ surface materials on the performance degradations such as the readable range, the radiation efficiency and the shift in the resonant frequency.
         
        
            Keywords : 
Pareto optimisation; antennas; genetic algorithms; radiofrequency identification; Pareto genetic algorithm; RFID tag antenna; T-matching network; meander line radiator; metal-line materials; performance degradation; radio frequency identification; resonant frequency; security systems; surface material; transportation cards; Degradation; Electronics packaging; Genetic algorithms; Inorganic materials; Pareto optimization; Production facilities; RFID tags; Radiofrequency identification; Road transportation; Security;
         
        
        
        
            Conference_Titel : 
Antennas and Propagation Society International Symposium, 2007 IEEE
         
        
            Conference_Location : 
Honolulu, HI
         
        
            Print_ISBN : 
978-1-4244-0877-1
         
        
            Electronic_ISBN : 
978-1-4244-0878-8
         
        
        
            DOI : 
10.1109/APS.2007.4395856