Title :
2-D numerical analysis of current collection in silicon solar cells
Author :
Burgers, A.R. ; de Moor, H.H.C. ; Sinke, W.C. ; Steeman, R.A.
Author_Institution :
Netherlands Energy Res. Found., Petten, Netherlands
Abstract :
An important aspect of solar cell design is top contact optimisation. A metallisation technology has characteristics of contact resistivity, a lower bound on finger width and the location of cell interconnections. The geometry of the top contact must be optimised taking into account those characteristics. Improvements in the geometry, although resulting in small performance gains, can be worthwhile because they do not imply extra fabrication costs. To obtain these improvements it is important to be able to simulate general geometries and hence two-dimensional effects in the potential distributions as well as the effect of the variations in emitter potential on the local current collection. The authors describe how a comprehensive and flexible program has been developed which analyses current collection in 2 lateral dimensions by numerical means. A finite difference method on a rectangular grid is employed to discretise the coupled Poisson equations, leading to systems of nonlinear equations
Keywords :
digital simulation; electrical contacts; electronic engineering computing; elemental semiconductors; finite difference methods; metallisation; nonlinear equations; optimisation; power engineering computing; semiconductor device models; silicon; solar cells; 2D numerical analysis; Si; cell interconnections; computer program; coupled Poisson equations; design; discretisation; emitter potential; fabrication costs; finger width; finite difference method; geometry; local current collection; nonlinear equations; performance; potential distributions; rectangular grid; resistivity; solar cells; top contact optimisation; Conductivity; Design optimization; Fabrication; Fingers; Geometry; Metallization; Numerical analysis; Performance gain; Photovoltaic cells; Silicon;
Conference_Titel :
Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
Conference_Location :
Louisville, KY
Print_ISBN :
0-7803-1220-1
DOI :
10.1109/PVSC.1993.347159