DocumentCode :
2311887
Title :
On-wafer probing measurement and simulation modeling correlation of spiral inductors for integrative passive device application
Author :
Tsai, Ming-Fan ; Fang, Boxiang ; Chen, Kuan Yu ; Yeh, Hsiao Hua ; Lee, Daniel ; Chen, Carl
Author_Institution :
Adv. Product Design & Testing Dept., Siliconware Precision Ind. Co., Ltd., Taichung, Taiwan
fYear :
2010
fDate :
20-22 Oct. 2010
Firstpage :
1
Lastpage :
4
Abstract :
Foundry process manufacture cost will increase with device size decrease from 28 nm to 22 nm. Wafer area will be focused on active device implementation. IC designer will want to implement passive device using package process not foundry process because cost concern. In this paper, we use Agilent ADS Momentum and EMpro to design and simulate spiral inductors and use our process capability to implement these inductors. From on-wafer probing measurement results, we can extract equivalent device model and relative parameters. This equivalent device model can be used in 2turns, 3turns...etc inductors. Finally, we will provide inductors´ library for circuit designers during IC design stage. Designers can design circuits using foundry process to implement active devices and using packaging process to implement passive devices.
Keywords :
electronics packaging; inductors; integrated circuit design; semiconductor device models; Agilent ADS Momentum; EMpro; foundry process manufacture cost; integrative passive device; on-wafer probing measurement; package process; spiral inductor; Data models; Equivalent circuits; Inductors; Integrated circuit modeling; Probes; Semiconductor device modeling; Spirals;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
Conference_Location :
Taipei
ISSN :
2150-5934
Print_ISBN :
978-1-4244-9783-6
Electronic_ISBN :
2150-5934
Type :
conf
DOI :
10.1109/IMPACT.2010.5699531
Filename :
5699531
Link To Document :
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