Title :
Spectral response and dark I-V characterization of polycrystalline Si solar cells with conventional and selective emitters
Author :
Sivoththaman, S. ; Rodot, M. ; Nam, Le Quang ; Sarti, D. ; Ghannam, M. ; Nijs, J.
Author_Institution :
CNRS, Meudon, France
Abstract :
High efficiency (up to 16.4%) 4cm2 polycrystalline silicon solar cells have been analyzed, using a simple analytical model to account for both spectral response and dark IV characteristics. The model allows the deduction, from measured data, of important cell parameters such as surface and bulk recombination velocities, emitter and base saturation currents. These parameters are discussed in terms of solar cell structure, wafer properties and process conditions. Increased base doping is shown to lead to a transition from base-dominated to emitter-dominated saturation current. The measured open circuit voltages can be accounted for, including the record values (636 mV) found for the highest base doping
Keywords :
electron-hole recombination; elemental semiconductors; semiconductor device models; semiconductor device testing; semiconductor doping; silicon; solar cells; 16.4 percent; 636 mV; Si; analytical model; base doping; base saturation current; bulk recombination velocity; dark I-V characteristics; emitter saturation current; open circuit voltages; polycrystalline semiconductor; process conditions; solar cells; spectral response; structure; surface recombination velocity; wafer properties; Analytical models; Circuits; Current measurement; Doping; Photovoltaic cells; Semiconductor device modeling; Semiconductor process modeling; Silicon; Velocity measurement; Voltage;
Conference_Titel :
Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
Conference_Location :
Louisville, KY
Print_ISBN :
0-7803-1220-1
DOI :
10.1109/PVSC.1993.347160