DocumentCode :
2312067
Title :
Electrowetting optical beam refractor
Author :
Chen, Hsiu-Hsiang ; Lin, C.C. ; Li, Y.T. ; Fu, C.
Author_Institution :
Ind. Technol. Res. Inst., Hsinchu, Taiwan
fYear :
2010
fDate :
20-22 Oct. 2010
Firstpage :
1
Lastpage :
4
Abstract :
This paper systematically studies and demonstrates how to lower the operating voltage for an electrowetting optical beam refractor (EOBR). The results indicate that a low operating voltage can be achieved by decreasing the thickness of the dielectric layer and employing a higher dielectric constant, together with reducing the interfacial surface tension between the electrolyte and the surrounding ambient phase. The goal of this study was to explore various approaches to achieving a low operating voltage. First, two kinds of fluoropolymers (Teflon®AF1601 and Cytop®CTL-809M) were utilized to confirm the wettability. Second, Si3N4 dielectric layer with different thickness were tested to confirm the thickness and dielectric constant effect. Finally, three different surfactants (sodium dodecyl sulfate (SDS), Triton X100 and Triton X15) were used to confirm the interfacial surface tension effect. In this article, We demonstrate that the contact angle of water can change as much as 80° in a dodecane/water/Cytop®/Si3N4 system (containing 1% SDS) with an applied voltage as low as 14 V; furthermore, switchable apex angles of ≃± 20° and deflection of a beam passing through the meniscus of EOBR are presented.
Keywords :
electro-optical devices; optical polymers; permittivity; beam passing; deflection; dielectric constant; dielectric layer; electrowetting optical beam refractor; fluoropolymers; operating voltage; Dielectric constant; Electrodes; Indium tin oxide; Laser beams; Optics; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
Conference_Location :
Taipei
ISSN :
2150-5934
Print_ISBN :
978-1-4244-9783-6
Electronic_ISBN :
2150-5934
Type :
conf
DOI :
10.1109/IMPACT.2010.5699542
Filename :
5699542
Link To Document :
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