DocumentCode
2312093
Title
An Estimation Model of Vulnerability for Embedded Microprocessors
Author
Chen, Yung-Yuan ; Hsu, Shu-Hao ; Leu, Kuen-Long
Author_Institution
Dept. of Comput. Sci. & Inf. Eng., Chung-Hua Univ., Hsinchu
fYear
2008
fDate
14-17 July 2008
Firstpage
224
Lastpage
225
Abstract
Embedded systems, and also the embedded microprocessors, have encountered the reliability challenge because the occurring probability of soft errors has a rising trend. When they are applied to safety-critical applications, designs with the fault tolerant consideration are required. For the complicated embedded systems or IP-based system-on-chip (SoC), it is unpractical and not cost-effective to protect the entire system or SoC. Analyzing the vulnerability of systems can help designers not only invest limited resource on the most crucial region but also understand the gain derived from the investment. In this paper we propose a model to fast estimate the microprocessor´s vulnerability with only slight simulation effort. From our assessment results, the rank of component vulnerability related to the probability of causing the microprocessor failure can be acquired. By choosing one of the mainstream microprocessors - VLIW (Very Long Instruction Word) processor - as an example, the practical usefulness of our estimation model is demonstrated.
Keywords
embedded systems; fault tolerant computing; microprocessor chips; safety-critical software; system-on-chip; IP-based system-on-chip; embedded microprocessors; embedded systems; fault tolerant consideration; mainstream microprocessors; microprocessor failure; microprocessor vulnerability; safety-critical applications; system vulnerability; very long instruction word processor; Computer errors; Computer science; Electronic mail; Embedded system; Error correction codes; Investments; Microprocessors; Reliability engineering; Single event upset; VLIW;
fLanguage
English
Publisher
ieee
Conference_Titel
Secure System Integration and Reliability Improvement, 2008. SSIRI '08. Second International Conference on
Conference_Location
Yokohama
Print_ISBN
978-0-7695-3266-0
Electronic_ISBN
978-0-7695-3266-0
Type
conf
DOI
10.1109/SSIRI.2008.12
Filename
4579833
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