• DocumentCode
    2312093
  • Title

    An Estimation Model of Vulnerability for Embedded Microprocessors

  • Author

    Chen, Yung-Yuan ; Hsu, Shu-Hao ; Leu, Kuen-Long

  • Author_Institution
    Dept. of Comput. Sci. & Inf. Eng., Chung-Hua Univ., Hsinchu
  • fYear
    2008
  • fDate
    14-17 July 2008
  • Firstpage
    224
  • Lastpage
    225
  • Abstract
    Embedded systems, and also the embedded microprocessors, have encountered the reliability challenge because the occurring probability of soft errors has a rising trend. When they are applied to safety-critical applications, designs with the fault tolerant consideration are required. For the complicated embedded systems or IP-based system-on-chip (SoC), it is unpractical and not cost-effective to protect the entire system or SoC. Analyzing the vulnerability of systems can help designers not only invest limited resource on the most crucial region but also understand the gain derived from the investment. In this paper we propose a model to fast estimate the microprocessor´s vulnerability with only slight simulation effort. From our assessment results, the rank of component vulnerability related to the probability of causing the microprocessor failure can be acquired. By choosing one of the mainstream microprocessors - VLIW (Very Long Instruction Word) processor - as an example, the practical usefulness of our estimation model is demonstrated.
  • Keywords
    embedded systems; fault tolerant computing; microprocessor chips; safety-critical software; system-on-chip; IP-based system-on-chip; embedded microprocessors; embedded systems; fault tolerant consideration; mainstream microprocessors; microprocessor failure; microprocessor vulnerability; safety-critical applications; system vulnerability; very long instruction word processor; Computer errors; Computer science; Electronic mail; Embedded system; Error correction codes; Investments; Microprocessors; Reliability engineering; Single event upset; VLIW;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Secure System Integration and Reliability Improvement, 2008. SSIRI '08. Second International Conference on
  • Conference_Location
    Yokohama
  • Print_ISBN
    978-0-7695-3266-0
  • Electronic_ISBN
    978-0-7695-3266-0
  • Type

    conf

  • DOI
    10.1109/SSIRI.2008.12
  • Filename
    4579833