Title :
Early Reliability Prediction: An Approach to Software Reliability Assessment in Open Software Adoption Stage
Author :
Lee, Wangbong ; Jung, Boo-Geum ; Baik, Jongmoon
Author_Institution :
Electron. Telecommun. Res. Inst., Seoul
Abstract :
Conventional software reliability models are not adequate to assess the reliability of software system in which OSS (Open Source Software) adopted as a new feature add-on because OSS can be modified while the inside of COTS(Commercial Off-The-Shelf) products cannot be changed. This paper presents an approach to software reliability assessment of OSS adopted software system in the early stage. We identified the software factors that affect the reliability of software system when a large software system adopts OSS and assess software reliability using those factors. They are code modularity and code maintainability in software modules related with system requirements. We used them to calculate the initial fault rate with weight index (correlated value between requirement and module) which represents the degree of code modification. We apply the proposed initial fault rate to reliability model to assess software reliability in the early stage of a software life cycle. Early software reliability assessment in OSS adoption helps to make an effective development and testing strategies for improving the reliability of the whole system.
Keywords :
public domain software; software maintenance; software packages; software reliability; COTS; OSS; commercial off-the-shelf products; open source software; reliability prediction; software reliability assessment; software system; Communication system software; Open source software; Programming; Software maintenance; Software measurement; Software performance; Software reliability; Software systems; Software testing; Weibull distribution; Embedded Systems; Module Complexity; Open Source Software; Software Reliability Prediction;
Conference_Titel :
Secure System Integration and Reliability Improvement, 2008. SSIRI '08. Second International Conference on
Conference_Location :
Yokohama
Print_ISBN :
978-0-7695-3266-0
Electronic_ISBN :
978-0-7695-3266-0
DOI :
10.1109/SSIRI.2008.46