1993 Best Paper Award was presented to Eric S. Snyder, David V. Campbell, Scot E. Swanson, and Donald G. Pierce for their article "Novel Self-stressing Test Structures for Realistic High Frequency Re1 iabi I ity Characterization."
Keywords :
Awards;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1995. 33rd Annual Proceedings., IEEE International
