Title :
A model of secondary emission for use in computer simulation of vacuum electronic devices
Author :
Chernin, D. ; Drobot, A. ; Kress, M.
Author_Institution :
Sci. Applications Int. Corp., McLean, VA, USA
Abstract :
A high fidelity model of the secondary emission process is essential in obtaining accurate results from computer simulations of certain vacuum electronic devices, including photomultiplier tubes, collectors in linear beam tubes, and distributed emission crossed-field amplifiers (CFA´s). Such a model is also required in simulations of phenomena like multipactor and some other discharges. The present paper sets out the requirements for a secondary emission model and presents a candidate. Some limitations of computer models of secondary emission are discussed. A computer simulation of a high power CFA, using the proposed model, is shown to produce good agreement with certain key measurements, including a measurement of cathode heating that is sensitive to secondary emission processes.<>
Keywords :
microwave amplifiers; microwave tubes; secondary electron emission; vacuum tubes; cathode heating; collectors; computer simulation; discharges; distributed emission crossed-field amplifiers; high power CFA; linear beam tubes; multipactor; photomultiplier tubes; secondary emission model; vacuum electronic devices; Application software; Computational modeling; Computer simulation; Distributed amplifiers; Educational institutions; Electron emission; Electron tubes; Photomultipliers; Power measurement; Silver;
Conference_Titel :
Electron Devices Meeting, 1993. IEDM '93. Technical Digest., International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-1450-6
DOI :
10.1109/IEDM.1993.347199