A model of secondary emission for use in computer simulation of vacuum electronic devices

Author

Chernin, D. ; Drobot, A. ; Kress, M.

Author_Institution

Sci. Applications Int. Corp., McLean, VA, USA

fYear

1993

fDate

5-8 Dec. 1993

Firstpage

773

Lastpage

776

Abstract

A high fidelity model of the secondary emission process is essential in obtaining accurate results from computer simulations of certain vacuum electronic devices, including photomultiplier tubes, collectors in linear beam tubes, and distributed emission crossed-field amplifiers (CFA´s). Such a model is also required in simulations of phenomena like multipactor and some other discharges. The present paper sets out the requirements for a secondary emission model and presents a candidate. Some limitations of computer models of secondary emission are discussed. A computer simulation of a high power CFA, using the proposed model, is shown to produce good agreement with certain key measurements, including a measurement of cathode heating that is sensitive to secondary emission processes.<>

Keywords

microwave amplifiers; microwave tubes; secondary electron emission; vacuum tubes; cathode heating; collectors; computer simulation; discharges; distributed emission crossed-field amplifiers; high power CFA; linear beam tubes; multipactor; photomultiplier tubes; secondary emission model; vacuum electronic devices; Application software; Computational modeling; Computer simulation; Distributed amplifiers; Educational institutions; Electron emission; Electron tubes; Photomultipliers; Power measurement; Silver;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices Meeting, 1993. IEDM '93. Technical Digest., International

Conference_Location

Washington, DC, USA

ISSN

0163-1918

Print_ISBN

0-7803-1450-6

Type

conf

DOI

10.1109/IEDM.1993.347199

Filename

347199