Title :
A survey of frequently identified vulnerabilities in commercial computing semiconductors
Author_Institution :
Security Center of Excellence (SeCoE), Intel Corp., Hillsboro, OR, USA
Abstract :
This paper summarizes the high level approach taken to security validation by design teams at a CPU Semiconductor manufacturer from architecture, through design, simulation and post-si testing. We review several functional areas that in our experience frequently yield vulnerabilities, describe some of the issues commonly found there, and touch on why these areas can be problematic. By highlighting these issues we hope to encourage future work in academia and industry on techniques to better find, mitigate, or prevent these problems.
Keywords :
security; semiconductor device manufacture; semiconductor industry; CPU semiconductor manufacturer; commercial computing semiconductors; design teams; frequently identified vulnerability; functional areas; high level approach; security validation; Hardware; Memory management; Microarchitecture; Registers; Security; Software; Security Validation; commercial semiconductor; vulnerabilities;
Conference_Titel :
Hardware-Oriented Security and Trust (HOST), 2011 IEEE International Symposium on
Conference_Location :
San Diego CA
Print_ISBN :
978-1-4577-1059-9
DOI :
10.1109/HST.2011.5955008