DocumentCode
2312283
Title
A survey of frequently identified vulnerabilities in commercial computing semiconductors
Author
Gotze, Kevin
Author_Institution
Security Center of Excellence (SeCoE), Intel Corp., Hillsboro, OR, USA
fYear
2011
fDate
5-6 June 2011
Firstpage
122
Lastpage
126
Abstract
This paper summarizes the high level approach taken to security validation by design teams at a CPU Semiconductor manufacturer from architecture, through design, simulation and post-si testing. We review several functional areas that in our experience frequently yield vulnerabilities, describe some of the issues commonly found there, and touch on why these areas can be problematic. By highlighting these issues we hope to encourage future work in academia and industry on techniques to better find, mitigate, or prevent these problems.
Keywords
security; semiconductor device manufacture; semiconductor industry; CPU semiconductor manufacturer; commercial computing semiconductors; design teams; frequently identified vulnerability; functional areas; high level approach; security validation; Hardware; Memory management; Microarchitecture; Registers; Security; Software; Security Validation; commercial semiconductor; vulnerabilities;
fLanguage
English
Publisher
ieee
Conference_Titel
Hardware-Oriented Security and Trust (HOST), 2011 IEEE International Symposium on
Conference_Location
San Diego CA
Print_ISBN
978-1-4577-1059-9
Type
conf
DOI
10.1109/HST.2011.5955008
Filename
5955008
Link To Document