DocumentCode
2312309
Title
Reliable and efficient PUF-based key generation using pattern matching
Author
Paral, Z. ; Devadas, S.
fYear
2011
fDate
5-6 June 2011
Firstpage
128
Lastpage
133
Abstract
We describe a novel and efficient method to reliably provision and re-generate a finite and exact sequence of bits, for use with cryptographic applications, e.g., as a key, by employing one or more challengeable Physical Unclonable Function (PUF) circuit elements. Our method reverses the conventional paradigm of using public challenges to generate secret PUF responses; it exposes response patterns and keeps secret the particular challenges that generate response patterns. The key is assembled from a series of small (initially chosen or random), secret integers, each being an index into a string of bits produced by the PUF circuit(s); a PUF unique pattern at each respective index is then persistently stored between provisioning and all subsequent key re-generations. To obtain the secret integers again, a newly repeated PUF output string is searched for highest-probability matches with the stored patterns. This means that complex error correction logic such as BCH decoders are not required. The method reveals only relatively short PUF output data in public store, thwarting opportunities for modeling attacks. We provide experimental results using data obtained from PUF ASICs, which show that keys can be efficiently and reliably generated using our scheme under extreme environmental variation.
Keywords
cryptography; error correction; probability; string matching; PUF ASIC; PUF based key generation; complex error correction logic; highest probability matches; modeling attacks; pattern matching; physical unclonable function circuit element; repeated PUF output string; secret PUF response; Authentication; Encoding; Error correction; Generators; Indexes; Pattern matching;
fLanguage
English
Publisher
ieee
Conference_Titel
Hardware-Oriented Security and Trust (HOST), 2011 IEEE International Symposium on
Conference_Location
San Diego CA
Print_ISBN
978-1-4577-1059-9
Type
conf
DOI
10.1109/HST.2011.5955010
Filename
5955010
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