Title :
Structural verification of a WLAN system using Built-in Self Tests
Author :
Webster, D. ; Cavazos, J. ; Guy, D. ; Patchen, P. ; Lie, D.Y.C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Tech Univ., Lubbock, TX, USA
Abstract :
This paper describes Built-in Self Test (BiST) techniques used to verify the integrity of a RF CMOS WLAN transceiver by Texas Instruments. The set of BiSTs covers the primary blocks in the RF/analog portion of the radio, verifying the system to be free of defects in a high volume production setting with minimal tester resources. This approach promotes a highly parallel testing opportunity, resulting in reduced test time with lower cost.
Keywords :
CMOS analogue integrated circuits; built-in self test; transceivers; wireless LAN; RF CMOS WLAN transceiver; Texas Instruments; WLAN system; built-in self tests; parallel testing; Circuit faults; Performance evaluation; Production; Radio frequency; System-on-a-chip; Testing; Wireless LAN; Built-in self-testing (BiST); CMOS integrated circuits; Wireless LAN;
Conference_Titel :
Circuits and Systems Workshop (DCAS), 2010 IEEE Dallas
Conference_Location :
Richardson, TX
Print_ISBN :
978-1-4244-9535-1
Electronic_ISBN :
978-1-4244-9534-4
DOI :
10.1109/DCAS.2010.5955035
