• DocumentCode
    2312641
  • Title

    A reduced-cost Built-in Self Test for an FM receiver

  • Author

    Mannath, D. ; Montano-Martinez, V. ; Syllaios, I. ; Bhatara, S. ; Attaluri, M. ; Parkar, Z. ; Ang, S.S.

  • fYear
    2010
  • fDate
    17-18 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper describes the methodology used to replace a conventional FM SNR test on a 65nm Texas Instruments radio with a similar test implemented as a Built-in Self Test (BiST). A traditional R square approach was used for the correlation. Data from various changes that affected/improved the correlation is presented. This approach resulted in test cost savings of around 40%.
  • Keywords
    radio receivers; FM SNR test; FM receiver; R square approach; Texas Instruments radio; reduced-cost built-in self test; Decision support systems; Tin; Built-in self-testing (BiST); CMOS integrated circuits; FM;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems Workshop (DCAS), 2010 IEEE Dallas
  • Conference_Location
    Richardson, TX
  • Print_ISBN
    978-1-4244-9535-1
  • Electronic_ISBN
    978-1-4244-9534-4
  • Type

    conf

  • DOI
    10.1109/DCAS.2010.5955036
  • Filename
    5955036