Title :
A reduced-cost Built-in Self Test for an FM receiver
Author :
Mannath, D. ; Montano-Martinez, V. ; Syllaios, I. ; Bhatara, S. ; Attaluri, M. ; Parkar, Z. ; Ang, S.S.
Abstract :
This paper describes the methodology used to replace a conventional FM SNR test on a 65nm Texas Instruments radio with a similar test implemented as a Built-in Self Test (BiST). A traditional R square approach was used for the correlation. Data from various changes that affected/improved the correlation is presented. This approach resulted in test cost savings of around 40%.
Keywords :
radio receivers; FM SNR test; FM receiver; R square approach; Texas Instruments radio; reduced-cost built-in self test; Decision support systems; Tin; Built-in self-testing (BiST); CMOS integrated circuits; FM;
Conference_Titel :
Circuits and Systems Workshop (DCAS), 2010 IEEE Dallas
Conference_Location :
Richardson, TX
Print_ISBN :
978-1-4244-9535-1
Electronic_ISBN :
978-1-4244-9534-4
DOI :
10.1109/DCAS.2010.5955036
