DocumentCode
231281
Title
Automatic Test Data Generation for Unit Testing to Achieve MC/DC Criterion
Author
Tianyong Wu ; Jun Yan ; Jian Zhang
Author_Institution
Technol. Center of Software Eng., Inst. of Software, Beijing, China
fYear
2014
fDate
June 30 2014-July 2 2014
Firstpage
118
Lastpage
126
Abstract
Modified Condition/Decision Coverage (MC/DC) became widely used in software testing, especially in safety-critical domain. However, existing testing tools often aim at achieving statement or branch coverage and do not support test generation for MC/DC. In this paper, we propose a novel test generation method to find appropriate test data for MC/DC. Specifically, we first extract paths from the target program and then find appropriate test data to trigger these paths. In the path extraction process, we propose a greedy strategy to determine the next selected branch. The evaluation results show that our method can actually generate test data quickly and the coverage increases a lot (up to 37.5%) compared with existing approaches.
Keywords
greedy algorithms; program testing; safety-critical software; software tools; MC/DC criterion; automatic test data generation; greedy strategy; modified condition/decision coverage; path extraction process; safety-critical domain; software testing; testing tools; unit testing; Data mining; Laboratories; Skeleton; Software; TV; Vectors; MC/DC; test data generation; unit testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Security and Reliability (SERE), 2014 Eighth International Conference on
Conference_Location
San Francisco, CA
Print_ISBN
978-1-4799-4296-1
Type
conf
DOI
10.1109/SERE.2014.25
Filename
6895422
Link To Document