DocumentCode
2312950
Title
Development of a novel planar mesh type micro-magnetic sensor for the quality inspection of electroplated materials
Author
Mukhopadhyay, S.C.
Author_Institution
Inst. of Inf. Sci. & Technol., Massey Univ., New Zealand
Volume
2
fYear
2002
fDate
2002
Firstpage
741
Abstract
The development work of a novel planar mesh type micro-magnetic sensor for the quality inspection of electroplated materials has been reported in this paper. The sensor is suitable for inspecting the quality of electroplated materials. The results obtained from the analytical model for the calculation of transfer impedance of the sensor have been discussed. The transfer impedance is used for the quality inspection of electroplated materials in an indirect way. The experimental results are reported which confirm the validity of the analytical model.
Keywords
electroplated coatings; inspection; magnetic sensors; modelling; nondestructive testing; quality control; analytical model; electroplated materials; micro-magnetic sensor; nondestructive evaluation technique; planar mesh type; quality inspection; transfer impedance calculation; Analytical models; Coils; Conducting materials; Conductivity; Impedance measurement; Inspection; Magnetic sensors; Material properties; Micromagnetics; Surface impedance;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors, 2002. Proceedings of IEEE
Print_ISBN
0-7803-7454-1
Type
conf
DOI
10.1109/ICSENS.2002.1037198
Filename
1037198
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