• DocumentCode
    2313305
  • Title

    Interconnect Slew Metric Using Nakagami-M Distribution

  • Author

    Gupta, S. ; Chattaraj, A. ; Kar, R. ; Mal, A.K.

  • Author_Institution
    Dept. of Electron. & Commun. Eng., Nat. Inst. of Technol., Durgapur
  • fYear
    2008
  • fDate
    16-18 July 2008
  • Firstpage
    400
  • Lastpage
    403
  • Abstract
    Slew rate determines the ability of a device to handle the varying signals. Determination of the slew rate to a good proximity is thus essential for efficient design of high speed CMOS integrated circuits. This in turn reduces the output switching surges in the device. Interconnect slew has become a crucial bottleneck for any high density and high speed VLSI circuits. In this paper we have proposed an accurate and efficient model to compute the slew metric of on chip interconnect of high speed CMOS VLSI deigns. Our slew metric is based on the Nakagami-M distribution function. Comparison of simulation results with other established models justifies the accuracy of our slew approach.
  • Keywords
    CMOS integrated circuits; Nakagami channels; VLSI; integrated circuit design; CMOS VLSI deign; CMOS integrated circuit; Nakagami-M distribution function; VLSI circuit; slew interconnection; CMOS integrated circuits; CMOS technology; Delay estimation; Design optimization; Integrated circuit interconnections; Integrated circuit technology; Nakagami distribution; Semiconductor device modeling; Surges; Very large scale integration; Interconnect; Probability distribution function; Slew metric; VLSI;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging Trends in Engineering and Technology, 2008. ICETET '08. First International Conference on
  • Conference_Location
    Nagpur, Maharashtra
  • Print_ISBN
    978-0-7695-3267-7
  • Electronic_ISBN
    978-0-7695-3267-7
  • Type

    conf

  • DOI
    10.1109/ICETET.2008.12
  • Filename
    4579932