DocumentCode
2313305
Title
Interconnect Slew Metric Using Nakagami-M Distribution
Author
Gupta, S. ; Chattaraj, A. ; Kar, R. ; Mal, A.K.
Author_Institution
Dept. of Electron. & Commun. Eng., Nat. Inst. of Technol., Durgapur
fYear
2008
fDate
16-18 July 2008
Firstpage
400
Lastpage
403
Abstract
Slew rate determines the ability of a device to handle the varying signals. Determination of the slew rate to a good proximity is thus essential for efficient design of high speed CMOS integrated circuits. This in turn reduces the output switching surges in the device. Interconnect slew has become a crucial bottleneck for any high density and high speed VLSI circuits. In this paper we have proposed an accurate and efficient model to compute the slew metric of on chip interconnect of high speed CMOS VLSI deigns. Our slew metric is based on the Nakagami-M distribution function. Comparison of simulation results with other established models justifies the accuracy of our slew approach.
Keywords
CMOS integrated circuits; Nakagami channels; VLSI; integrated circuit design; CMOS VLSI deign; CMOS integrated circuit; Nakagami-M distribution function; VLSI circuit; slew interconnection; CMOS integrated circuits; CMOS technology; Delay estimation; Design optimization; Integrated circuit interconnections; Integrated circuit technology; Nakagami distribution; Semiconductor device modeling; Surges; Very large scale integration; Interconnect; Probability distribution function; Slew metric; VLSI;
fLanguage
English
Publisher
ieee
Conference_Titel
Emerging Trends in Engineering and Technology, 2008. ICETET '08. First International Conference on
Conference_Location
Nagpur, Maharashtra
Print_ISBN
978-0-7695-3267-7
Electronic_ISBN
978-0-7695-3267-7
Type
conf
DOI
10.1109/ICETET.2008.12
Filename
4579932
Link To Document