DocumentCode
2313636
Title
Power System Blackout Model via OPF and Its Self-organized Criticality
Author
MEI, Shengwei ; Wang, Gang
Author_Institution
Dept. of Electr. Eng., Tsinghua Univ., Beijing
fYear
2008
fDate
12-15 Oct. 2008
Firstpage
1
Lastpage
8
Abstract
Based on the essence of self-organized criticality, this paper develops a novel model to study the cascading failures and blackouts in power systems with optimal power flow applications, which contains two types of dynamics, fast dynamics and slow dynamics. This model has also voltage stability analysis capacity and can reveal critical characteristics from the reactive power and voltage viewpoint. Simulation results of IEEE 30-bus system with the proposed model show that the fast dynamics simulation can capture both the process of the cascading failures and the self-organized criticality property respect to the micro scale. Furthermore, the macro scale of self-organized criticality of power systems can be revealed according to the ratio of total load demand to the total network power transfer capability. Finally, this work has verified that improving the transmission capability of network could effectively reduce blackout risk.
Keywords
load flow; power system dynamic stability; power transmission faults; self-organised criticality; IEEE 30-bus system; cascading failures; fast dynamics simulation; load demand; network power transfer capability; optimal power flow applications; power system blackout model; reactive power; self-organized criticality property; transmission capability; voltage stability analysis capacity; Load flow; Power system analysis computing; Power system dynamics; Power system faults; Power system modeling; Power system protection; Power system simulation; Power system stability; Stability analysis; Voltage; Blackout Model; Cascade Failures; Optimal Power Flow; Self-Organized Criticality; Voltage Stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Power System Technology and IEEE Power India Conference, 2008. POWERCON 2008. Joint International Conference on
Conference_Location
New Delhi
Print_ISBN
978-1-4244-1763-6
Electronic_ISBN
978-1-4244-1762-9
Type
conf
DOI
10.1109/ICPST.2008.4745236
Filename
4745236
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