DocumentCode :
2313766
Title :
Non-idealities of temperature sensors using substrate pnp transistors
Author :
Pertijs, Michiel A P ; Meijer, Gerard C M ; Huijsing, Johan H.
Author_Institution :
Electron. Instrum. Lab., Delft Univ. of Technol., Netherlands
Volume :
2
fYear :
2002
fDate :
2002
Firstpage :
1018
Abstract :
This paper describes the nonidealities of temperature sensors based on substrate pnp transistors and shows how their influence can be minimized The effects of series resistance, current-gain variation, high-level injection and the Early effect on the accuracy of the PTAT voltage are discussed. The results of measurements made on substrate pnp transistors in a standard 0.5 μm CMOS process are presented to show the effects of these nonidealities. It is shown that the modeling of the PTAT voltage can be improved by taking the temperature dependency of the effective emission coefficient into account using the reverse Early effect. With this refinement, the temperature can be extracted from the measurement data with an absolute accuracy of ±0.1°C in the range of -50°C to 130°C.
Keywords :
CMOS integrated circuits; energy gap; intelligent sensors; reference circuits; temperature sensors; -50 to 130 degC; 0.5 micron; CMOS process; Early effect; PTAT voltage; absolute accuracy; current-gain variation; effective emission coefficient; high-level injection; measurement data; nonidealities; reverse Early effect; series resistance; substrate pnp transistors; temperature dependency; temperature sensors; Bipolar transistors; CMOS process; CMOS technology; Data mining; Measurement standards; Semiconductor device measurement; Temperature distribution; Temperature measurement; Temperature sensors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2002. Proceedings of IEEE
Print_ISBN :
0-7803-7454-1
Type :
conf
DOI :
10.1109/ICSENS.2002.1037251
Filename :
1037251
Link To Document :
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