• DocumentCode
    2313796
  • Title

    Effect of low temperature on the micro-impact fracture behavior of Sn-Ag-Cu solder joint

  • Author

    Liu, D.S. ; Hsu, C.L. ; Kuo, C.Y. ; Huang, Y.L. ; Lin, K.L. ; Shen, G.S.

  • Author_Institution
    Dept. of Mech. Eng., Nat. Chung Cheng Univ., Chiayi, Taiwan
  • fYear
    2010
  • fDate
    20-22 Oct. 2010
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    In this work, the failure characteristics of lead-free solder joint were investigated with low temperature micro-impact test. A impact testing method with shear rate of 1 m/s and temperatures ranging from room temperature to -40°C was set up to measure the interfacial strength of solder joints for evaluating the reliability. Experimental results have shown that the testing temperatures were found to have strong effects on the impact resistance and fracture mechanisms of Sn-Ag-Cu lead-free solder joint. The failure mode percentage, the peak load, and the energy to peak load under changing low temperature conditions will be presented in this paper.
  • Keywords
    copper alloys; electronics packaging; fracture; impact testing; silver alloys; solders; tin alloys; impact testing method; lead-free solder joint; low temperature; micro-impact fracture behavior; Lead; Scanning electron microscopy; Soldering; Temperature; Temperature control; Temperature measurement; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4244-9783-6
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2010.5699648
  • Filename
    5699648