Title :
Classification of Impulse Fault Patterns in Transformers Using Wavelet Network
Author :
Rajamani, P. ; Dey, D. ; Chatterjee, B. ; Chakravorti, S.
Author_Institution :
Dept. of Electr. Eng., Jadavpur Univ., Kolkata
Abstract :
Accurate identification of winding faults that may develop during impulse testing of transformer is of great importance for ensuring reliability and quality of power supply. In the case of fault the resulting winding current gets changed to a certain extent. The pattern of fault current depends on the type of fault and its location along the length of the winding. The proposed method is based on wavelet network, which can be proposed as an alternative to feed forward neural network for approximating complex non-linear function such as the impulse fault current waveform. The trained wavelet network is used for estimation of impulse fault current of various type and location. By analyzing the extracted weight parameters of the optimally trained wavelet network the second stage of network can classify the fault type and its location along the winding. Results of electromagnetic transient program based digital model of transformer show the ability of this approach for classification of various types of impulse faults.
Keywords :
EMTP; feedforward neural nets; nonlinear functions; pattern classification; power supply quality; power transformers; wavelet transforms; complex nonlinear function; digital transformer model; electromagnetic transient program; feed forward neural network; impulse fault current waveform; impulse fault pattern classification; impulse testing; power supply quality; power supply reliability; wavelet network; winding faults; EMTP; Fault currents; Fault diagnosis; Feedforward neural networks; Feeds; Impulse testing; Neural networks; Power supplies; Transformers; Wavelet analysis; EMTP model; Function estimation; Impulse fault classification; wavelet Network;
Conference_Titel :
Power System Technology and IEEE Power India Conference, 2008. POWERCON 2008. Joint International Conference on
Conference_Location :
New Delhi
Print_ISBN :
978-1-4244-1763-6
Electronic_ISBN :
978-1-4244-1762-9
DOI :
10.1109/ICPST.2008.4745287