• DocumentCode
    2314479
  • Title

    Embedded ground planes using sidewall insulators for high frequency interconnections in integrated circuits

  • Author

    Gardner, D.S. ; Vu, Q.T. ; van Wijnen, P.J. ; Maloney, T.J. ; Fraser, D.B.

  • Author_Institution
    Components Res. Lab., Intel Corp., Santa Clara, CA, USA
  • fYear
    1993
  • fDate
    5-8 Dec. 1993
  • Firstpage
    251
  • Lastpage
    254
  • Abstract
    Cross-talk disturbance and signal delay from interconnections are intensifying as dimensions reduce and circuit frequencies increase, significantly impacting the performance of integrated circuits. A new structure called an embedded ground plane with sidewall insulators can be used to control the impedance and reduce cross talk and dispersion of signals. The S-parameters of 0.3 /spl mu/m lines with ground planes were measured up to 18 GHz and used to obtain the propagation function. The parasitics from the pads was eliminated using a new dc-embedding technique based on T-matrices. The resulting transmission line transfer function is then used to simulate the pulse response of interconnections using Fourier transforms.<>
  • Keywords
    Fourier transforms; S-parameters; crosstalk; high-frequency transmission line measurement; integrated circuit technology; packaging; 0.3 micron; 18 GHz; DC embedding technique; Fourier transforms; S-parameters; T-matrices; crosstalk disturbance; embedded ground planes; high frequency interconnections; propagation function; pulse response; sidewall insulators; signal delay; signal dispersion; transmission line transfer function; Delay; Fourier transforms; Frequency; Impedance; Insulation; Integrated circuit interconnections; Integrated circuit measurements; Scattering parameters; Transfer functions; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1993. IEDM '93. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-1450-6
  • Type

    conf

  • DOI
    10.1109/IEDM.1993.347358
  • Filename
    347358