Title : 
The role of ultrafast torsional relaxation in the emission from polythiophene aggregates
         
        
            Author : 
Parkinson, P. ; Muller, C. ; Stingelin, N. ; Johnston, M.B. ; Herz, L.M.
         
        
            Author_Institution : 
Dept. of Electron. Mater. Eng., Australian Nat. Univ., Canberra, ACT, Australia
         
        
        
        
        
        
            Abstract : 
An understanding of aggregation effects in organic semiconductors is essential for their effective use in optoelectronic devices. Typically, the electronic dynamics in such systems are heavily dependant upon the aggregation state, and dynamics often occur on subnanosecond timescales. Here, we determined the singlet exciton population within isolated and aggregated P3HT regions using time-resolved photoluminescence measurements, and find a strong decay pathway in the aggregated case only. Comparison of the emission from the lowest two vibronic bands demonstrates a changeover from isolated chain to aggregate-like emission within ~14 ps corresponding to timescales for torsional relaxation in these materials. We conclude that formation of an aggregate excited state in conjugated polymers is mediated by vibrational relaxation from a low-symmetry to a high-symmetry, ordered state for the ensemble.
         
        
            Keywords : 
aggregation; conducting polymers; excitons; high-speed optical techniques; organic semiconductors; photoluminescence; time resolved spectra; aggregate excited state; aggregation state; conjugated polymers; optoelectronic devices; organic semiconductors; polythiophene aggregates; singlet exciton population; time-resolved photoluminescence; ultrafast torsional relaxation; vibrational relaxation; vibronic bands; Logic gates; Microscopy; Polymers;
         
        
        
        
            Conference_Titel : 
Optoelectronic and Microelectronic Materials and Devices (COMMAD), 2010 Conference on
         
        
            Conference_Location : 
Canberra, ACT
         
        
        
            Print_ISBN : 
978-1-4244-7334-2
         
        
            Electronic_ISBN : 
1097-2137
         
        
        
            DOI : 
10.1109/COMMAD.2010.5699689