Title :
New Technique for Fault Detection in Quantum Cellular Automata
Author :
Mathew, Binu K. ; John, Shajimon K. ; Pradeep, C.
Author_Institution :
SAINTGITS Coll. of Eng., Kottayam
Abstract :
Quantum cellular automata (QCA) circuits, the new generation nanotechnology with wide attention in recent years. In this we are proposing a framework based on QCA for finding out the stuck-at fault of a circuit. The existing technologies and methods are not guaranteed to detect the stuck-at faults. This work is motivated by the fact that the stuck-at fault test set of a circuit is not guaranteed to detect all defects that can occur in its QCA implementation.
Keywords :
cellular automata; combinational circuits; fault diagnosis; logic testing; majority logic; quantum gates; fault detection; quantum cellular automata; stuck-at fault test; CMOS technology; Circuit faults; Circuit testing; Electrical fault detection; Electrons; Fault detection; Nanotechnology; Quantum cellular automata; Quantum dots; Semiconductor device modeling; Majority Gate; Majority Voter; QCA; Stuck-at-faults; Test Vectors;
Conference_Titel :
Emerging Trends in Engineering and Technology, 2008. ICETET '08. First International Conference on
Conference_Location :
Nagpur, Maharashtra
Print_ISBN :
978-0-7695-3267-7
Electronic_ISBN :
978-0-7695-3267-7
DOI :
10.1109/ICETET.2008.186
