DocumentCode
2314596
Title
Research and Design of a New Kind of Optical Current Transducer
Author
Yansong, Li ; Qian, Wang ; Daqian, Ma ; Jun, Liu ; Hao, Zhou
Author_Institution
Sch. of Electr. & Electron. Eng., North China Electr. Power Univ., Beijing
fYear
2008
fDate
12-15 Oct. 2008
Firstpage
1
Lastpage
4
Abstract
This paper introduces a new kind of optical current transducer and its application in measuring high voltage DC and AC in power system. To solve the long-term operating stability and the steady state metering accuracy which influence the practical course of OCT, this paper presents a new method which combines the lock-in amplifier in slight photo-electric signal detection and a new higher stability sensor, introduces the principle and the design of the optical sensor on solenoid collecting magnetic field, and analyzes the characteristics of signal and noise in OCT. This paper also describes the principle and the performance of the lock-in amplifier and its application in OCT in order to improve the output SNR. The test results indicate that under the steady state metering accuracy has already reached class 0.2, the long-term stability has improved, and the designed OCT has achieved the requests in power system.
Keywords
photodetectors; power system measurement; transducers; OCT; SNR; lock-in amplifier; optical current transducer; power system; slight photo-electric signal detection; solenoid collecting magnetic field; stability sensor; steady state metering; Current measurement; Magnetic sensors; Optical amplifiers; Optical design; Optical sensors; Power system stability; Stability analysis; Steady-state; Stimulated emission; Transducers; AC current Measurement; DC current Measurement; Lock-in amplifier; Operating stability; Optical current transducer; Optical sensor on solenoid collecting magnetic field; Output SNR; Steady state metering accuracy;
fLanguage
English
Publisher
ieee
Conference_Titel
Power System Technology and IEEE Power India Conference, 2008. POWERCON 2008. Joint International Conference on
Conference_Location
New Delhi
Print_ISBN
978-1-4244-1763-6
Electronic_ISBN
978-1-4244-1762-9
Type
conf
DOI
10.1109/ICPST.2008.4745297
Filename
4745297
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