• DocumentCode
    2314641
  • Title

    Gaussian process regression: active data selection and test point rejection

  • Author

    Seo, Sambu ; Wallat, Marko ; Graepel, Thore ; Obermayer, Klaus

  • Author_Institution
    Dept. of Comput. Sci., Tech. Univ. Berlin, Germany
  • Volume
    3
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    241
  • Abstract
    We consider active data selection and test point rejection strategies for Gaussian process regression based on the variance of the posterior over target values. Gaussian process regression is viewed as transductive regression that provides target distributions for given points rather than selecting an explicit regression function. Since not only the posterior mean but also the posterior variance are easily calculated we use this additional information to two ends: active data selection is performed by either querying at points of high estimated posterior variance or at points that minimize the estimated posterior variance averaged over the input distribution of interest or (in a transductive manner) averaged over the test set. Test point rejection is performed using the estimated posterior variance as a confidence measure. We find that, for both a two-dimensional toy problem and a real-world benchmark problem, the variance is a reasonable criterion for both active data selection and test point rejection
  • Keywords
    Gaussian distribution; covariance matrices; estimation theory; learning (artificial intelligence); neural nets; statistical analysis; Gaussian process regression; active data selection; active learning; covariance matrix; function estimation; neural nets; posterior variance; test point rejection; transductive regression; two-dimensional toy problem; Benchmark testing; Computer science; Covariance matrix; Gaussian processes; Geophysical measurements; Machine learning; Neural networks; Performance evaluation; Statistical analysis; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 2000. IJCNN 2000, Proceedings of the IEEE-INNS-ENNS International Joint Conference on
  • Conference_Location
    Como
  • ISSN
    1098-7576
  • Print_ISBN
    0-7695-0619-4
  • Type

    conf

  • DOI
    10.1109/IJCNN.2000.861310
  • Filename
    861310