Title :
Threshold selection for wavelet denoising of partial discharge data
Author :
Agoris, Pantelis D. ; Meijer, Sander ; Gulski, Edward ; Smit, Johan J.
Author_Institution :
Dept. of High Voltage Technol. & Manage., Delft Univ. of Technol., Netherlands
Abstract :
UHF partial discharge (PD) measurements taken onsite are frequently affected by noise due to external disturbances. In order to locate the discharge source, the PD-signals have to be accurately processed to calculate the arrival time in each sensor. A wavelet based denoising technique is used to isolate the PD signals from the noise. The technique utilizes the one-dimensional discrete wavelet transform and the soft and hard thresholding are compared. Crucial is the choice of threshold level, distinguishing between coefficients related with noise and those associated with the PD signal. Four threshold criteria: the Stein´s unbiased risk estimator, its Heuristic variance, the universal logarithmic threshold and the minimax are investigated. Finally, the technique is tested on PD signals detected in a power transformer.
Keywords :
UHF detectors; discrete wavelet transforms; minimax techniques; partial discharge measurement; power transformers; risk analysis; Heuristic variance; PD-signals; Stein´s unbiased risk estimator; UHF sensors; discrete wavelet transform; hard thresholding; minimax; partial discharge measurements; power transformer; soft thresholding; ultra-high frequency; universal logarithmic threshold; wavelet denoising technique; Discrete wavelet transforms; Fault location; Minimax techniques; Noise level; Noise measurement; Noise reduction; Partial discharge measurement; Partial discharges; Testing; UHF measurements;
Conference_Titel :
Electrical Insulation, 2004. Conference Record of the 2004 IEEE International Symposium on
Print_ISBN :
0-7803-8447-4
DOI :
10.1109/ELINSL.2004.1380450