DocumentCode :
2315080
Title :
Application of Artificial Neural Networks in Determining Critical Clearing Time in Transient Stability Studies
Author :
Krishna, D. Rama ; Murthy, K. V S Ramachandra ; Rao, G. Govinda
Author_Institution :
G.V.P. Coll. of Eng., Visakhapatnam
fYear :
2008
fDate :
12-15 Oct. 2008
Firstpage :
1
Lastpage :
6
Abstract :
This paper describes a neural network based adaptive pattern recognition approach by making a thorough analysis on a power system for estimation of the critical clearing time. A nine bus system is considered for the purpose of transient stability analysis. Faults at five locations are assumed at different instants. Critical clearing times for all five faults at six different loading levels are obtained. Out of thirty cases, 24 cases corresponding to four faults have been used for training the neural network and remaining six CCTs corresponding to the fifth fault at six loading levels obtained by ANN as well as modified Eular method. The same is repeated for all five faults. Nueral network designed with 12 input neurons, 8 hidden neurons and one output neuron. Back propagation technique is used to adjust the weights. Analytical calculations are compared with the values obtained by neural network. Results show that ANN gives accurate results.
Keywords :
neural nets; pattern recognition; power engineering computing; power system transient stability; adaptive pattern recognition; artificial neural networks; critical clearing time; modified Eular method; nine bus system; power system; transient stability analysis; Adaptive systems; Artificial neural networks; Neural networks; Neurons; Pattern analysis; Pattern recognition; Power system analysis computing; Power system faults; Power system stability; Power system transients; Back propagation; Critical clearing time; Neural Network; Transient Stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power System Technology and IEEE Power India Conference, 2008. POWERCON 2008. Joint International Conference on
Conference_Location :
New Delhi
Print_ISBN :
978-1-4244-1763-6
Electronic_ISBN :
978-1-4244-1762-9
Type :
conf
DOI :
10.1109/ICPST.2008.4745324
Filename :
4745324
Link To Document :
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