Title :
BIST Based Performance Evaluation of Field Programmable Analog Arrays
Author :
Charhate, Savita ; Mishra, D.K.
Author_Institution :
Electron. & Instrum. S.G.S.I.T.S., Indore
Abstract :
A typical field programmable analog array consists of configurable analog arrays (CABs), I/O blocks, an interconnection network and memory registers for device programming. For testing purposes, this FPAA partitioning also applies. Taking advantage of the inherent programmability of the FPAAs, BIST (built-in-self-testing) based scheme is used to obtain an error signal representing the difference between fault free and faulty circuits. A comparison between the various testing methodologies is done in terms of area overhead, circuit performance degradation, fault coverage etc.
Keywords :
built-in self test; field programmable analogue arrays; integrated circuit interconnections; built-in-self-testing based scheme; circuit performance degradation; configurable analog arrays; device programming; fault coverage; fault free circuits; faulty circuits; field programmable analog arrays; interconnection network; memory registers; performance evaluation; Built-in self-test; Capacitors; Circuit testing; Clocks; Digital control; Field programmable analog arrays; Integrated circuit interconnections; Switches; Switching circuits; Voltage; Built in Self Test; Field Programmable Analog Array; Testing; VLSI; fault model;
Conference_Titel :
Emerging Trends in Engineering and Technology, 2008. ICETET '08. First International Conference on
Conference_Location :
Nagpur, Maharashtra
Print_ISBN :
978-0-7695-3267-7
Electronic_ISBN :
978-0-7695-3267-7
DOI :
10.1109/ICETET.2008.169
