DocumentCode :
2315189
Title :
Electrical properties of p-n junction GaSb fabricated from spin coating using Zn-diffusion method
Author :
Ramelan, A.H. ; Goldys, E.M. ; Arifin, P.
Author_Institution :
Phys. Dept., Sebelas Maret Univ. (UNS), Surakarta, Indonesia
fYear :
2010
fDate :
12-15 Dec. 2010
Firstpage :
183
Lastpage :
184
Abstract :
The GaSb-based material system is attractive for application in photovoltaic (PV) cells since its band gap can be tuned to match the radiation of the emitter. At present, most of the PV cells are fabricated using epitaxial layers and hence are expensive. To reduce the cost, Zn diffusion using elemental vapors in a semiclosed diffusion system is conducted. In this paper, we present studies carried out on Zn diffusion into n-type (Te-doped) GaSb substrates in an open tube diffusion furnace. The diffusion was carried out at a temperature of 600°C, for a diffusion time from 4 to 12 hours. The diffused layers were characterized by current-voltage and capacitance-voltage measurements.
Keywords :
III-V semiconductors; gallium compounds; p-n junctions; spin coating; surface diffusion; tellurium; zinc; GaSb:Te; Zn; capacitance-voltage measurement; current-voltage measurement; electrical properties; open tube diffusion furnace; p-n junction; spin coating; temperature 600 degC; time 4 h to 12 h; Capacitance-voltage characteristics; Current density; Semiconductor device measurement; Semiconductor diodes; Substrates; Zinc;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices (COMMAD), 2010 Conference on
Conference_Location :
Canberra, ACT
ISSN :
1097-2137
Print_ISBN :
978-1-4244-7334-2
Electronic_ISBN :
1097-2137
Type :
conf
DOI :
10.1109/COMMAD.2010.5699729
Filename :
5699729
Link To Document :
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