DocumentCode :
2315242
Title :
How RFID reliability effects inventory control accuracy
Author :
Jones, Erick C. ; Verma, Vikram ; Volakis, John L. ; Jiang, Mei
Author_Institution :
Univ. of Nebraska, Lincoln
fYear :
2007
fDate :
9-15 June 2007
Firstpage :
2757
Lastpage :
2760
Abstract :
Companies seek to reduce inventory holding and labor cost by utilizing automatic identification technologies such as radio frequency identification (RFIDs). RFIDs are an enabling technology for inventory tracking and have recently become an incurred expense (for some companies) due to mandates from the Department of Defense and large retailers such as Wal-Mart. These organizations envision that use of RFIDs will reduce distribution costs within their respective industries. Pundits suggest that RFIDs allow for real-time inventory control as compared to other auto-id technologies at a reduced cost. However, some implementations of RFID suggest this technology may not be reliable, causing costs increases in the form of excess inventory and labor needed to buffer the technology failures. Herewith, we suggest reliability improvements through quality control techniques so that the purported savings in time and costs can be realized. A method for testing, evaluating and improving RFID reliability is presented for RFID subcomponents, prototyped systems, and implantation environments.
Keywords :
cost reduction; inventory management; quality control; radiofrequency identification; reliability; RFID reliability; automatic identification technology; inventory holding cost reduction; inventory tracking; labor cost reduction; quality control technique; radio frequency identification; real-time inventory control; Inventory control; Radiofrequency identification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2007 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-0877-1
Electronic_ISBN :
978-1-4244-0878-8
Type :
conf
DOI :
10.1109/APS.2007.4396106
Filename :
4396106
Link To Document :
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