Title :
THz tomography in transmission and reflection
Author :
Brahm, A. ; Pradarutti, B. ; Kunz, M. ; Riehemann, S. ; Notni, G. ; Nolte, S. ; Tünnermann, A.
Author_Institution :
Fraunhofer Inst. for Appl. Opt. & Precision Eng. (IOF), Jena, Germany
Abstract :
A THz-system which can measure ultrashort THz-pulses simultaneously in transmission and in reflection under 0deg and off-axis under 15deg is presented. By combining the time resolved analysis of the three measurement directions, a high amount of information of the inner sample structure can be obtained. For first analysis concepts the main pulse amplitude and spectral information of transmittance measurements were evaluated.
Keywords :
spectral analysis; terahertz wave imaging; tomography; THz reflection; THz tomography system; THz transmission; spectral information; time resolved analysis; transmittance measurement; ultrashort THz-pulse measurement; Electric variables measurement; Focusing; Information analysis; Laser excitation; Mirrors; Optical reflection; Phase measurement; Pulse measurements; Time measurement; Tomography;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5416-7
Electronic_ISBN :
978-1-4244-5417-4
DOI :
10.1109/ICIMW.2009.5324635
