Title :
Prony-based technique for voltage envelope extraction and estimation of instantaneous flicker level
Author :
Cheng-I Chen ; Yeong-Chin Chen ; Chao-Nan Chen ; Ru-Huei Liang
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Jhongli, Taiwan
Abstract :
The accurate extraction of voltage envelope is an important process for the flicker estimation. According to the latest IEC standard for design of flickermeter, the factor of fundamental frequency deviation is necessary to be taken into account. Therefore, a Prony-based technique is proposed in this paper. With the characteristic of high-frequency resolution in this method, the extraction of voltage envelope can be accurately performed for the time-varying power signals.
Keywords :
IEC standards; power system measurement; voltage measurement; IEC standard; flicker estimation; flickermeter; high frequency resolution; instantaneous flicker level; prony based technique; time-varying power signals; voltage envelope extraction; Accuracy; Demodulation; Discrete wavelet transforms; Estimation; IEC standards; Power quality; Voltage fluctuations;
Conference_Titel :
Power Electronics and Drive Systems (PEDS), 2013 IEEE 10th International Conference on
Conference_Location :
Kitakyushu
Print_ISBN :
978-1-4673-1790-0
Electronic_ISBN :
2164-5256
DOI :
10.1109/PEDS.2013.6527082
