DocumentCode :
2315984
Title :
A dynamically tracking clock distribution chip with skew control
Author :
Chengson, Dave ; Costantino, Lino ; Khan, Aurangzeb ; Le, Duc ; Yue, Lordson
Author_Institution :
Tandem Comput. Inc., Cupertino, CA, USA
fYear :
1990
fDate :
13-16 May 1990
Abstract :
A novel single-chip clock distribution circuit is described. This circuit is a self-calibrating synchronization system that receives a periodic, digital clock signal as a reference and generates multiple system clock signals that dynamically track and are synchronized to the reference clock across temperature, voltage, and process variations. This chip is used as an integral part of the clock distribution for a fault-tolerant computer system. Results from ATE and bench testing of this clock chip are presented. The edge rate, granularity, pin-to-pin skew, ASIC to nonASIC delay line, and clock jitter characteristics are verified to exceed collectively the specifications of commercially available products
Keywords :
bipolar integrated circuits; clocks; digital integrated circuits; emitter-coupled logic; fault tolerant computing; integrated circuit testing; synchronisation; transistor-transistor logic; ASIC to nonASIC delay line; bench testing; clock chip; clock jitter characteristics; dynamically tracking clock distribution chip; edge rate; fault-tolerant computer system; generates multiple system clock signals; granularity; pin-to-pin skew; reference clock; self-calibrating synchronization system; single-chip clock distribution circuit; skew control; Circuits; Clocks; Distributed computing; Fault tolerant systems; Signal generators; Signal processing; Synchronization; Temperature; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 1990., Proceedings of the IEEE 1990
Conference_Location :
Boston, MA
Type :
conf
DOI :
10.1109/CICC.1990.124747
Filename :
124747
Link To Document :
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