• DocumentCode
    2316202
  • Title

    Optical hysteresis in mesoporous silicon microcavities

  • Author

    Pham, A. ; Qiao, H. ; Guan, B. ; Gal, M. ; Reece, P.J.

  • Author_Institution
    Sch. of Phys., Univ. of New South Wales, Sydney, NSW, Australia
  • fYear
    2010
  • fDate
    12-15 Dec. 2010
  • Firstpage
    81
  • Lastpage
    82
  • Abstract
    We report on the observation of transient optical bistability in mesoporous silicon microcavity resonators in transmission and reflection when illuminated by a 532nm nanosecond pulsed laser. The properties of the bistablility such as the hysteresis area, the onset and damaged threshold intensities are shown to be porosity dependent. Our model suggests that the bistability is due to the induced nonlinear refractive index changes and the transient lifetime increases with increasing porosity. The role of surface states in the bistability process was also investigated by passivating the internal porous surface using the hydrosilylation chemistry.
  • Keywords
    hysteresis; mesoporous materials; microcavities; optical bistability; optical materials; optical resonators; porosity; refractive index; silicon; Si; hydrosilylation chemistry; internal porous surface; mesoporous silicon microcavities; nonlinear refractive index; optical hysteresis; porosity; reflection; surface states; transient lifetime; transient optical bistability; transmission; wavelength 532 nm; Clocks; Nonlinear optics; Optical bistability; Optical films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optoelectronic and Microelectronic Materials and Devices (COMMAD), 2010 Conference on
  • Conference_Location
    Canberra, ACT
  • ISSN
    1097-2137
  • Print_ISBN
    978-1-4244-7334-2
  • Electronic_ISBN
    1097-2137
  • Type

    conf

  • DOI
    10.1109/COMMAD.2010.5699791
  • Filename
    5699791