DocumentCode :
2316202
Title :
Optical hysteresis in mesoporous silicon microcavities
Author :
Pham, A. ; Qiao, H. ; Guan, B. ; Gal, M. ; Reece, P.J.
Author_Institution :
Sch. of Phys., Univ. of New South Wales, Sydney, NSW, Australia
fYear :
2010
fDate :
12-15 Dec. 2010
Firstpage :
81
Lastpage :
82
Abstract :
We report on the observation of transient optical bistability in mesoporous silicon microcavity resonators in transmission and reflection when illuminated by a 532nm nanosecond pulsed laser. The properties of the bistablility such as the hysteresis area, the onset and damaged threshold intensities are shown to be porosity dependent. Our model suggests that the bistability is due to the induced nonlinear refractive index changes and the transient lifetime increases with increasing porosity. The role of surface states in the bistability process was also investigated by passivating the internal porous surface using the hydrosilylation chemistry.
Keywords :
hysteresis; mesoporous materials; microcavities; optical bistability; optical materials; optical resonators; porosity; refractive index; silicon; Si; hydrosilylation chemistry; internal porous surface; mesoporous silicon microcavities; nonlinear refractive index; optical hysteresis; porosity; reflection; surface states; transient lifetime; transient optical bistability; transmission; wavelength 532 nm; Clocks; Nonlinear optics; Optical bistability; Optical films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices (COMMAD), 2010 Conference on
Conference_Location :
Canberra, ACT
ISSN :
1097-2137
Print_ISBN :
978-1-4244-7334-2
Electronic_ISBN :
1097-2137
Type :
conf
DOI :
10.1109/COMMAD.2010.5699791
Filename :
5699791
Link To Document :
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