DocumentCode
2316202
Title
Optical hysteresis in mesoporous silicon microcavities
Author
Pham, A. ; Qiao, H. ; Guan, B. ; Gal, M. ; Reece, P.J.
Author_Institution
Sch. of Phys., Univ. of New South Wales, Sydney, NSW, Australia
fYear
2010
fDate
12-15 Dec. 2010
Firstpage
81
Lastpage
82
Abstract
We report on the observation of transient optical bistability in mesoporous silicon microcavity resonators in transmission and reflection when illuminated by a 532nm nanosecond pulsed laser. The properties of the bistablility such as the hysteresis area, the onset and damaged threshold intensities are shown to be porosity dependent. Our model suggests that the bistability is due to the induced nonlinear refractive index changes and the transient lifetime increases with increasing porosity. The role of surface states in the bistability process was also investigated by passivating the internal porous surface using the hydrosilylation chemistry.
Keywords
hysteresis; mesoporous materials; microcavities; optical bistability; optical materials; optical resonators; porosity; refractive index; silicon; Si; hydrosilylation chemistry; internal porous surface; mesoporous silicon microcavities; nonlinear refractive index; optical hysteresis; porosity; reflection; surface states; transient lifetime; transient optical bistability; transmission; wavelength 532 nm; Clocks; Nonlinear optics; Optical bistability; Optical films;
fLanguage
English
Publisher
ieee
Conference_Titel
Optoelectronic and Microelectronic Materials and Devices (COMMAD), 2010 Conference on
Conference_Location
Canberra, ACT
ISSN
1097-2137
Print_ISBN
978-1-4244-7334-2
Electronic_ISBN
1097-2137
Type
conf
DOI
10.1109/COMMAD.2010.5699791
Filename
5699791
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