Viewing the nanoworld in infrared/THz light

Author

Keilmann, Fritz

Author_Institution

Max Planck Inst. for Quantum Opt., Garching, Germany

fYear

2009

fDate

21-25 Sept. 2009

Firstpage

1

Lastpage

4

Abstract

Near-field techniques have overcome the diffraction limit that plagues classical light microscopy. Liberated from this century-long constraint the power of infrared/THz spectroscopy can now be unleashed for material inspection at virtually unlimited spatial resolution. In the competition with electron and atomic-force microscopes infrared/THz nanoscopy has the distinct, valuable advantage of rich spectral contrasts that originate from and thus reveal chemical composition (molecular vibration), structural status (phonons), and conductivity (ions, electrons, and correlated charge carriers).

Keywords

infrared imaging; infrared spectroscopy; light scattering; microwave photonics; nanophotonics; near-field scanning optical microscopy; spectrochemical analysis; submillimetre wave imaging; terahertz spectroscopy; chemical composition; conductivity; correlated charge carriers; electrons; infrared-THz nanoscopy; infrared-terahertz spectroscopy; ions; material inspection; molecular vibration; nanoworld; phonons; rich spectral contrasts; structural status; terahertz s-SNOM; unlimited spatial resolution; Chemicals; Conducting materials; Conductivity; Diffraction; Electron microscopy; Infrared spectra; Inspection; Phonons; Spatial resolution; Spectroscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on

Conference_Location

Busan

Print_ISBN

978-1-4244-5416-7

Electronic_ISBN

978-1-4244-5417-4

Type

conf

DOI

10.1109/ICIMW.2009.5324706

Filename

5324706