DocumentCode :
2316311
Title :
Analysis of stress in the fiber-array with FEM
Author :
Jeong, B. ; Lee, S.
Author_Institution :
Samsung Electron. Co. Ltd., Suwon, South Korea
fYear :
2003
fDate :
23-28 March 2003
Firstpage :
59
Abstract :
The stress in the fiber-array makes it segregated slowly. This paper deals with the analysis of stress in the fiber-array according to the different epoxy thickness and length. We considered two sorts of fiber-arrays that have 127/250 μm channel spacing respectively.
Keywords :
channel spacing; finite element analysis; optical fibre communication; stress analysis; wavelength division multiplexing; 127 micron; 250 micron; FEM; WDM system; channel spacing; epoxy length; epoxy thickness; fiber-array; stress analysis; Birefringence; Fourier series; Lead; Optical filters; Optical polarization; Optical refraction; Optical retarders; Optical tuning; Stress; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical Fiber Communications Conference, 2003. OFC 2003
Print_ISBN :
1-55752-746-6
Type :
conf
DOI :
10.1109/OFC.2003.1247488
Filename :
1247488
Link To Document :
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