DocumentCode
2316312
Title
A 14ns 256kx1 CMOS SRAM with multiple test modes
Author
Pfermings ; Phelan, C. ; Voss, P. ; Davies, T. ; O´Connell, C. ; Bell, S. ; Salters, R. ; Ontrop, H.
Author_Institution
Philips Research Laboratories
fYear
1988
fDate
0-0 1988
Firstpage
41
Lastpage
42
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits, 1988. Digest of Technical Papers., 1988 Symposium on
Conference_Location
Tokyo, Japan
Type
conf
DOI
10.1109/VLSIC.1988.1037414
Filename
1037414
Link To Document