A process-insensitivity voltage down converter suitable for half-micron SRAM´s

Author

Hayakawa, S. ; Sato, K. ; Aono, A. ; Yoshida, T. ; Ohmi, Tadahiro ; Ochii, K.

Author_Institution

Toshiba Microcomputer Engineering Corp.

fYear

1988

fDate

0-0 1988

Firstpage

Lastpage

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Circuits, 1988. Digest of Technical Papers., 1988 Symposium on

Conference_Location

Tokyo, Japan

Type

DOI

10.1109/VLSIC.1988.1037420

Filename

1037420

Link To Document