DocumentCode

2316426

Title

Improvement of soft error rate in MOS SRAMs

Author

Murakami, S. ; Ichinose, K. ; Anami, K. ; Kayano, S.

Author_Institution

Mitsubishi Electric Corporation

fYear

1988

fDate

0-0 1988

Firstpage

57

Lastpage

58

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Circuits, 1988. Digest of Technical Papers., 1988 Symposium on

Conference_Location

Tokyo, Japan

Type

conf

DOI

10.1109/VLSIC.1988.1037422

Filename

1037422