Title :
Improvement of soft error rate in MOS SRAMs
Author :
Murakami, S. ; Ichinose, K. ; Anami, K. ; Kayano, S.
Author_Institution :
Mitsubishi Electric Corporation
Conference_Titel :
VLSI Circuits, 1988. Digest of Technical Papers., 1988 Symposium on
Conference_Location :
Tokyo, Japan
DOI :
10.1109/VLSIC.1988.1037422
