Title :
Measurement of linearity in THz-TDS
Author :
Withayachumnankul, Withawat ; Ung, Benjamin S Y ; Fischer, Bernd M. ; Abbott, Derek
Author_Institution :
Dept. of Inf. Eng., King Mongkut´´s Inst. of Technol. Ladkrabang, Bangkok, Thailand
Abstract :
This article presents an approach to the measurement of the amplitude linearity in terahertz time-domain spectroscopy (THz-TDS) systems. The approach exploits a single wafer of high-purity float-zone silicon to produce multiple Fabry-Perot reflections, which are stepwise attenuated and delayed. Comparison between the theoretical and experimental results can indicate a deviation in linearity.
Keywords :
interference spectrometers; silicon; terahertz spectroscopy; time-domain analysis; Fabry-Perot reflections; THz-TDS; high-purity float-zone silicon; linearity measurement; terahertz time-domain spectroscopy systems; Calibration; Dielectrics; Electromagnetic measurements; Linearity; Optical devices; Optical reflection; Silicon; Slabs; Submillimeter wave measurements; Time domain analysis;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5416-7
Electronic_ISBN :
978-1-4244-5417-4
DOI :
10.1109/ICIMW.2009.5324721
