DocumentCode

2316494

Title

Enhanced implication for automatic test pattern generation

Author

Hamilton

Author_Institution

NEC Corporation

fYear

1988

fDate

0-0 1988

Firstpage

69

Lastpage

70

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Circuits, 1988. Digest of Technical Papers., 1988 Symposium on

Conference_Location

Tokyo, Japan

Type

conf

DOI

10.1109/VLSIC.1988.1037427

Filename

1037427